Spatially-resolved and In-Situ Characterization of Thin Films and Engineered Surfaces II (H1-2-TuA)
Tuesday, May 21 2019 1:40PM, Room Pacific Salon 1
Moderated by: Grégory Abadias, Institut Pprime - CNRS - ENSMA - Université de Poitiers; Xavier Maeder, Empa - Swiss Federal Laboratories for Materials Science and Technology; Michael Tkadletz, Montanuniversität Leoben
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
1:40 PMH1-2-TuA-1Complex Study of Thermally Induced Order Reactions in Cu-Au Thin Films
2:00 PMH1-2-TuA-2Kinetics Dependence of Microstructure and Stress Evolutions in Polycrystalline Cu Films: Real-time Diagnostics and Atomistic Modelling
2:20 PMH1-2-TuA-3Understanding the Crystallization of Amorphous Films with Embedded Seed Crystals using High-resolution STEM Composition and Structural Mapping
2:40 PMH1-2-TuA-4 In-situ Investigation of the Oxidation Behavior of Metastable CVD Ti1-xAlxN Using Combined Synchrotron XRD and DSC
3:00 PMH1-2-TuA-5In-situ X-ray Characterization of Liquid-solid Transition Phase in Small Volume
4:00 PMH1-2-TuA-8Novel Quantitative Thin Film Thickness and Chemical State Analysis X-ray Techniques
4:20 PMH1-2-TuA-9Effect of Heat Treatment on Microstructure of Erbia Film on Steel Substrate with Yittria Buffer Layer Fabricated by MOCVD
4:40 PMH1-2-TuA-10Detailed Characterization of Interface Structure of Thin Aluminum Films Deposited on a Highly Reactive Metallic Surface
5:00 PMH1-2-TuA-11Study of Volmer-Weber Thin Film Growth Mechanisms by Coupling in situ Resistivity, Optical and Mechanical Measurements
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