Spatially-resolved and In-Situ Characterization of Thin Films and Engineered Surfaces I (H1-1-TuM)
Tuesday, May 21 2019 8:00AM, Room Pacific Salon 1
Moderated by: Grégory Abadias, Institut Pprime - CNRS - ENSMA - Université de Poitiers; Xavier Maeder, Empa - Swiss Federal Laboratories for Materials Science and Technology; Michael Tkadletz, Montanuniversität Leoben
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
8:20 AMH1-1-TuM-2Evolution of the Nanoporous Structure of Sintered Ag Joints at High Temperature using In-Situ X-ray Nanotomography
8:40 AMH1-1-TuM-3Atom Probe Tomography to Help Understand Deformation Mechanisms in Metallic Alloys
9:20 AMH1-1-TuM-5On the Chemical Composition of TiAlN Thin Films - Comparison of Ion Beam Analysis and Laser-assisted Atom Probe Tomography with Varying Laser Pulse Energy
9:40 AMH1-1-TuM-6Microstructure and Oxidation States of Ni in Sub-Nanometric Layer Depending on its Seed-Layer (Zinc Oxide, Silver Layers): A Multi-Techniques Approach to Trespass Limits of Resolution
10:00 AMH1-1-TuM-7Nanomechanical Investigation on Lateral fcc-w Phase Fields of a Partially Decomposed and Transformed Nano‑lamellar CVD fcc‑Ti0.2Al0.8N Coating
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