Spatially-resolved and In-Situ Characterization of Thin Films and Engineered Surfaces I (H1-1-MoM)
Monday, Apr 27 2020 10:00AM, Room Pacific Salon 6-7
Moderated by: Grégory Abadias, Institut Pprime - CNRS - ENSMA - Université de Poitiers, France
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
10:00 AMH1-1-MoM-1Cross-sectional Nanodiffraction and TEM Reveal In-situ Indentation Response of AlN-CrN Superlattice Multilayer
10:20 AMH1-1-MoM-2Nano-scale Residual Stress Profiling in Ultra-thin Si3N4/ZnO Multilayer Stacks using FIB-DIC Method
11:00 AMH1-1-MoM-4Deformation Mechanisms in Nanocrystalline-Amorphous Cu/Ta Coatings
11:20 AMH1-1-MoM-5Multimodal and in situ Electron Microscopy to Understand Local Deformation Mechanics
Page size:
 4 items in 1 pages