Spatially-resolved Characterization of Thin Films and Engineered Surfaces (H1-)
Thursday, Apr 26 2018 8:00AM, Room Royal Palm 1-3
Moderated by: Xavier Maeder, EMPA - Swiss Federal Laboratories for Materials Science and Technology; Michael Tkadletz, Montanuniversität Leoben
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
Logon for Personal Schedule SchedulePaper #Invited TalkTitle
9:00 AMH1-4Spatially Resolved Depth Profiling Of Residual Stress By Micro-Ring-Core Method
9:20 AMH1-5Quantitative Depth Profiling from the First Nanometers Down to the Substrate within Minutes using RF GD-OES
9:40 AMH1-6Analysis of Thin Film Surface Stress Distribution using Raman Spectroscopy near Cohesive Cracks During Bending Tests
10:00 AMH1-7In situ Nanomechanical Characterization of Transition Metal Carbides
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